The JANNuS-SCALP platform has instruments allowing the characterization of materials by using ion beams.
Ion Beam Analysis (IBA) brings together techniques for characterizing materials using physical phenomena resulting from ion-matter interactions. At JANNuS-SCALP, the available analysis are Rutherford Backscattering Spectrometry (RBS) in channeling geometry (RBS/C), Elastic Recoil Detection Analysis (ERDA), Particle Induced X-ray Emission (PIXE) and Particle Induced Gamma-ray Emission (PIGE).
These analysis techniques allow an elementary quantification of materials, with a depth profile down to a thickness of a few microns below the surface of the material.
The addition of the channeling technique (e.g. RBS/C) allows studying the crystallinity of materials, that are a priori single crystals. The analysis of single crystal damage by RBS/C is also available in situ, i.e. with ion implantations up to a temperature of 600°C (using the coupling of IRMA and ARAMIS accelerators).
The PIGE technique allows the isotopic quantification of specimens.